LCOS-SLM (Liquid Crystal on Silicon - Spatial Light …
LCOS-SLM (Liquid Crystal on Silicon - Spatial Light Modulator) X10468/X13267/X13138 series 5 The X10468/X13267/X13138 series is a pure phase SLM with high precision phase control; therefore, it has high diffraction efﬁ ciency close to
Link to this page:
Documents from same domain
2 Distance image sensors are image sensors that measure the distance to the target object using the TOF (time-of-flight) method. Used in combination with a pulse modulated light source, these sensors output phase
I nfrared D etectors Infrared detectors Infrared detectors are widely used in diverse field including measurement, analysis, industry, communication, agriculture, medicine,
Si Photodiodes 44 Light absorption meter This is a light absorption meter using a dedicated IC and two photodiodes which provides a logarithmic ratio of two current
Consolidated Financial Results for the First Quarter of Fiscal Year ending September 30, 2018 (Japanese GAAP) February 5, 2018 Company name: Hamamatsu Photonics K.K. Stock listing: Tokyo Stock Exchange First Section
1 S13360 series MPPCs for precision measurement MPPC® (Multi-Pixel Photon Counter) www.hamamatsu.com MPPC is a type of device called SiPM (silicon photomultipliers). It is a new type of photon counting device that consists of
2 - Considering silicon’s narrow bandgap (1.14 eV) and due to higher transition probability of a photoelectron from a silicon crystal’s valence band to its conduction band than emission probability of a photoelectron from an
MAGNIFICATION CALIBRATION DIFFRACTION GRATING REPLICA PRODUCT NO. 673. This specimen is a replica of a 2,000 lines/mm cross line diffraction grating on which 0.262µm diameter
I 01. Light with a wavelength of 460 nm strikes a diffraction grating with slits that are 0.0180 mm apart. At what angle from the center of the interference pattern will the third-order maximum occur?
Physics 102 Lab 8: Measuring wavelengths with a diffraction grating Dr. Timothy C. Black Spring, 2005 Theoretical Discussion The diﬀraction of classical waves refers to the phenomenon wherein the waves encounter an obstacle that
AMMRC MS 83-1 . THE MEASUREMENT OF RESIDUAL STRESS WITH X-RAY DIFFRACTION CHARLES P. GAZZARA MATERIALS CHARACTERIZATION DIVISION May 1983 Approved for public release; distribution unlimited.